Name: Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

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Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Lugar de origem:

China

Marca:

WINNER

Certificação:

ISO9100

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Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Detalhes do produto

Nome do produto:

sonda de ensaio de mola

barril:

PB, dourado

Êmbolo Inferior:

BeCu/SK4, banhado a ouro

Êmbolo SUPERIOR:

Liga Pd/Não Banhado

PRIMAVERA:

SWPB(SUS)/banhado a ouro

Disponibilidade:

Tamanhos personalizados disponíveis

Revestimento:

Ouro banhado

Classificação atual:

Resistência de contato:

100 mohms no máximo

Largura de banda:

-0,17 dB a 19,6 GHz

indutância:

1,25nH

Captação:

1,61 pF

Golpe total:

1,00 mm

Duração nominal:

0,65 mm

Força de mola:

30 gramas@o.65mm

A vida mecânica excede:

200k

Destacar:

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Termos do pagamento & do transporte

Quantidade de ordem mínima

3000pcs

Preço

999

Detalhes da embalagem

Embalagem neutral ou com logotipo OEM

Tempo de entrega

5-8 dias úteis

Termos de pagamento

L/C, União Ocidental, T/T

Habilidade da fonte

100000 rolos por mês

PRODUTOS CONEXOS

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

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Descrição do produto

High Efficiency BGA Testing Probes

Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications.

Key Product Features

Ultra-Fine Precision: 0.11 mm plunger and 0.15 mm barrel for micro-pitch PCB pads, IC leads, flex circuits, and semiconductor testing
High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Production Specifications

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

Etiquetas：

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

China Supplier ICT test probe P048

CHINA Supply YF-100 Brass Material Spring Contact Probe Pin

Preço direto da fábrica sondas de pino de teste de mola

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