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100mil Spring Test Probe with Crown Tip and BeCu Plunger for High Hitting Accuracy

100mil Spring Test Probe with Crown Tip and BeCu Plunger for High Hitting Accuracy

100mil Spring Test Probe

Crown Tip ICT Test Probe

BeCu Plunger Pogo Pin

Lugar de origem:

China

Marca:

WINNER

Certificação:

ISO9100

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Detalhes do produto
Nome do produto:
sonda de teste de tamanho padrão
Manger:
Becu
barril:
Latão
Primavera:
Aço inoxidável
Disponibilidade:
Tamanhos personalizados disponíveis
Revestimento:
Ouro banhado
Quantidade mínima:
100 unidades
Destacar:

100mil Spring Test Probe

,

Crown Tip ICT Test Probe

,

BeCu Plunger Pogo Pin

Termos do pagamento & do transporte
Quantidade de ordem mínima
1 unidade
Preço
999
Detalhes da embalagem
Embalagem neutral ou com logotipo OEM
Tempo de entrega
5-8 dias úteis
Termos de pagamento
L/C, União Ocidental, T/T
Habilidade da fonte
100000 rolos por mês
Descrição do produto
Standard ICT Test Probes - 100mil - Crown (CA, CB, CC, CG)
These spring-loaded test probes are designed for ICT test fixtures (bed of nails), offering high hitting accuracy and long-life expectancy. The 4-point crown tip on CA, CB, and CC versions ensures excellent component pin contact, while the CG version features a multipoint tip for versatile applications. The CC version includes self-cleaning functionality.
Product Specifications
Specification Details
Type Probe test pin
Material Brass
Plating Layer Gold Plated
Color Gold
Package PE Bag
Current resistance 50mΩ
MOQ 100PCS
Payment T/T
Delivery time 5-10 days after receiving payment
Test Probe Selection Guide
Test probes are available from many manufacturers with similar constraints. When selecting a test probe receptacle, the tip choice is the most critical consideration.
100mil Spring Test Probe with Crown Tip and BeCu Plunger for High Hitting Accuracy 0
Detailed illustration of test probe components and construction
100mil Spring Test Probe with Crown Tip and BeCu Plunger for High Hitting Accuracy 1
Various test probe tip types
Customization Options
At SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD., we offer comprehensive customization:
  • Custom diameters to match your specific requirements
  • Custom plating thicknesses for optimal conductivity and durability
  • Custom mechanical specifications tailored to your application
All products include material traceability documentation and certificate of analysis for quality assurance.
Contact us to request samples or a quotation for your specific application requirements.
100mil Spring Test Probe with Crown Tip and BeCu Plunger for High Hitting Accuracy 2
Our probe manufacturing facility
100mil Spring Test Probe with Crown Tip and BeCu Plunger for High Hitting Accuracy 3
Quality control inspection
100mil Spring Test Probe with Crown Tip and BeCu Plunger for High Hitting Accuracy 4
Packaged probes ready for shipment

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